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See Past Events
SWTest Asia 2026
The Semiconductor Wafer Test Asia Conference (SWTest Asia) is celebrating over 5 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing within the Asia test community. The conference has the perfect mixture of manufacturer and vendor presentations. This probe technology forum is where attendees come to learn about recent developments in the industry and exchange ideas. This is a relaxed atmosphere with a golf tournament, EXPO, social activities and plenty of time for informal discussion and networking.
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Nov 5 - Nov 6 2026 Zhubei City, Taiwan Sheraton Hsinchu Hotel
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SWTest Asia 2026 November 5, 2026 7:39 AM November 6, 2026 7:39 AM Sheraton Hsinchu Hotel The Semiconductor Wafer Test Asia Conference (SWTest Asia) is celebrating over 5 years as the only industry event that focuses on all the aspects associated with microelectronic wafer and die level testing within the Asia test community. The conference has the perfect mixture of manufacturer and vendor presentations. This probe technology forum is where attendees come to learn about recent developments in the industry and exchange ideas. This is a relaxed atmosphere with a golf tournament, EXPO, social activities and plenty of time for informal discussion and networking. /content/entegris-live/en/home/about-us/events/swtest-asia-2026

Join Us | Booth A08

At SWTest Asia 2026, visit Entegris at Booth A08 to learn how advanced cleaning materials can help improve probe card performance, extend card lifetime, and reduce the overall cost of testing. Leveraging innovative Dual Action MEMS cleaning technology, Entegris solutions are designed to efficiently remove debris and contamination while minimizing pin wear, helping maintain consistent electrical contact and reliable test results. Qualification studies have demonstrated up to a 35% reduction in probe card re-order and technician cleaning costs, along with a 12% reduction in overall cost of test. Discover how Entegris helps semiconductor manufacturers improve wafer-level test efficiency and reliability.

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