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Particle Characterization

Advanced particle count and size analyzers providing high resolution and accuracy in CMP slurries and other suspensions.

Our Particle Characterization solutions enable customers to perform particle size analysis both in the laboratory and online, in real time, directly in the fluid stream process. In advanced-node CMP applications, automating the monitoring process can help prevent costly yield excursions. The AccuSizer® SPOS systems and Nicomp® Nano DLS/ZLS systems are used in a wide variety of industries including pharmaceutical, chemical, ink, and contamination control.

Particle Characterization Applications

Narrow Your Selection
  • Brand Name
  • Product Type
  • Industry
AccuSizer® SPOS Systems
AccuSizer® SPOS Systems
AccuSizer® SPOS Systems
High resolution and high concentration particle counters that use Single Particle Optical Sizing (SPOS) technology to accurately determine particle size and counts at the tail end of your distributions
Brand Name
  • AccuSizer®
 Product Type
  • Single Particle Optical Sizing (SPOS) System
 Industry
  • Life Sciences
  • Semiconductor
Nicomp® Nano DLS/ZLS Systems
Nicomp® Nano DLS/ZLS Systems
Nicomp® Nano DLS/ZLS Systems
The Nicomp® dynamic light scattering (DLS) system measures the size and zeta potential of sub-micron particles, while providing extreme versatility and high sensitivity
Brand Name
  • Nicomp®
 Product Type
  • Dynamic Light Scattering (DLS) System
 Industry
  • Life Sciences
  • Semiconductor
Process Monitoring Systems
Process Monitoring Systems
Process Monitoring Systems
Processing monitoring systems perform automated online particle size and/or counts analysis of suspensions
Brand Name
  • AccuSizer®
  • Nicomp®
 Product Type
  • Process Monitoring System
 Industry
  • Semiconductor
  • Life Sciences
Mini DLS System
Mini DLS System
Mini DLS System
On-line particle size analyzer for nanoparticles and emulsions from 20 nm to 2 μm
Brand Name
  • Mini DLS
 Product Type
  • Dynamic Light Scattering (DLS) System
 Industry
  • Life Sciences
  • Semiconductor
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