Since SEMICON Europa 2018, with the support of SEMI and carmakers, Entegris has been sharing a New Collaborative Approach, a process to tackle defectivity with an improved contamination management strategy.
Since SEMICON Europa 2018, with the support of SEMI and carmakers, Entegris has been sharing a New Collaborative Approach, a process to tackle defectivity with an improved contamination management strategy.
/content/entegris-live/en/home/about-us/events/semicon-europa-2022Join Us | Hall C1, Booth #219
Discover how through the science of innovation, we can partner together to solve your most complex manufacturing process challenges.
Contact europe@entegris.com to get a free voucher and redeem it online.
Featured Presentation
Automotive Reliability – Contamination Management and Maturity of the Ecosystems
WEDNESDAY, NOVEMBER 16 | 14:00 PM CET
EXECUTIVE FORUM, HALL B1
In this presentation we will share our progress:
- Meaningful defectivity management trends.
- What we have we learned in terms of ecosystem maturity.
- Correlations with major technology inflection points.
- Where semiconductor manufacturers should focus their efforts.
Presented by Antoine Amade, VP of sales for the Microcontamination Control division in EMEA/NA and head of Entegris’ automotive program.
Event Related Content
GAAC Panel Discussion: Collaboration Across the Automotive and Semiconductor Supply Chains
Watch Andreas Aal, CARIAD, a Volkswagen Group Company, Bettina Weiss, SEMI, Antoine Amade and Jennifer Braggin, Entegris, explore the intersection of automotive innovation and semiconductor technologies and describe the opportunities presented by collaborating across these supply chains.
Materials Innovation: Holistic Solutions for Improved Yield and Reliability
Learn about:
- Digital transformation and the demand for higher performance chips
- New, purer materials needed to deliver high-yield and long-term reliability
- Holistic materials and handling solutions to enable a new approach to the most challenging yield problems of advanced node technologies.
Advanced CMP of Silicon Carbide for EVs and Power ICs
In this webinar, Fadi Coder, director, global applications will address the challenges specific to SiC polishing process, slurry performance improvement to address new technical challenges, and the benefits of offering an encompassing synergetic solution to improve yield.
EUV Enablement: Solving Defect Challenges in the EUV Process
In this webinar, Entegris' Dr. Wenge Yang discusses the latest technology developments related to EUV implementation and how to reduce defectivity and variability challenges in the EUV process.
ESD Challenges in Fluid Handling Systems: A Shock to the System
- Why is the industry moving away from stainless steel to PFA materials for transporting process fluids?
- How can you defend against dangerous ESD in fluid handling systems?
Join Dave Kemkes, Senior Product Marketing Manager, and Rick Lindblom, Director of Product Marketing Fluid Handling, as they discuss these topics and introduce Entegris’ new ESD solutions.
Industry Insights
As automotive electronics become more complex and prevalent, the cost of failure in these devices rises. Hidden defects caused by small particles, gels, metal ions, and organic contaminants can lead to failures throughout the vehicle’s life, escalating costs and increasing risk. How can you prevent hidden defects?
As the automotive paradigm shifts from mechanical to electronic-centric vehicles, carmakers must now meet parts per billion (ppb) failure rates.
To achieve these goals and improve long-term reliability, they look to semiconductor manufacturers and the automotive component supply chain to collaborate and assure the functional safety of new modes of transportation.
To achieve optimal wafer yield and reliability, the microelectronics industry needs to address the increased materials consumption requirements and material purity challenges from chemical manufacture to point of use.
Achieving your zero-defect goals require contaminant-free process gases. Preventing these defects requires a holistic approach from the gas generation source through the delivery, storage, and dispense steps in the semiconductor fab.
Major fabs understand the need for complete solutions that improve yield in all aspects of the CMP process. Shrinking feature size, along with the need for tighter defectivity and particle control in the CMP slurry is driving innovative changes in filtration and monitoring systems. We are in the position to offer single source solutions and eliminate introducing unnecessary contamination risk from incompatible chemicals or consumables.
Achieving the performance goals of a new generation of automotive electronics requires a precise precursor and plasma gas combination. The selection can be done with ease using the Entegris toolbox.
Through the front (FEOL) and back (BEOL) end of semiconductor manufacturing lines, wafers are continuously transported and stored. Entegris solutions prevent the corrosion that may lead to reliability failures and wafer breakage during these critical steps, helping to reduce wafer and component defects.